Infrared and raman spectroscopy studies on pulsed PECVD a-Si:H Films
This work presents a study on the structural properties of hydrogenated amorphous silicon (a-Si:H) prepared by pulsed plasma enhanced chemical vapour deposition (PECVD) technique using Raman and infrared spectroscopy. The bonded hydrogen content and hydrogen bonding configurations in the a-Si:H film...
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| Format: | Article |
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2007
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| Online Access: | http://eprints.um.edu.my/7362/ http://eprints.um.edu.my/7362/1/Infrared_and_Raman_Spectroscopy_Studies_on_Pulsed_PECVD_a%2DSiH_Films.pdf |