Direct growth of freestanding GaN on C-face SiC by HVPE

In this work, high quality GaN crystal was successfully grown on C-face 6H-SiC by HVPE using a two steps growth process. Due to the small interaction stress between the GaN and the SiC substrate, the GaN was self-separated from the SiC substrate even with a small thickness of about 100 μm. Moreover,...

Full description

Bibliographic Details
Main Authors: Tian, Yuan, Shao, Yongliang, Wu, Yongzhong, Hao, Xiaopeng, Zhang, Lei, Dai, Yuanbin, Huo, Qin
Format: Online
Language:English
Published: Nature Publishing Group 2015
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4451798/