Scaling properties of ballistic nano-transistors
Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated ID - VD-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution, the...
Main Authors: | Wulf, Ulrich, Krahlisch, Marcus, Richter, Hans |
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Format: | Online |
Language: | English |
Published: |
Springer
2011
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Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211455/ |
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