Scaling properties of ballistic nano-transistors

Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated ID - VD-traces separating the regimes of classically allowed transport and tunneling transport. In this conference contribution, the...

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Bibliographic Details
Main Authors: Wulf, Ulrich, Krahlisch, Marcus, Richter, Hans
Format: Online
Language:English
Published: Springer 2011
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211455/