Soft error analysis and mitigation in circuits involving c-elements
A SEU or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlock in an asynchronous system or production of incorrect outputs due to data corruption. The first part of this thesis studies the impact of...
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Format: | Thesis |
Language: | English English |
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University of Newcastle
2015
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Online Access: | http://ir.unimas.my/9395/ http://ir.unimas.my/9395/1/Soft%20Error%20Analysis%20and%20Mitigation%20In%20Circuits%20Involving%20C-Elements%2824pages%29.pdf http://ir.unimas.my/9395/2/Soft%20Error%20Analysis%20and%20Mitigation%20In%20Circuits%20Involving%20C-Elements.pdf |