Soft error analysis and mitigation in circuits involving c-elements

A SEU or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlock in an asynchronous system or production of incorrect outputs due to data corruption. The first part of this thesis studies the impact of...

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Bibliographic Details
Main Author: Norhuzaimin, bin Julai
Format: Thesis
Language:English
English
Published: University of Newcastle 2015
Subjects:
Online Access:http://ir.unimas.my/9395/
http://ir.unimas.my/9395/1/Soft%20Error%20Analysis%20and%20Mitigation%20In%20Circuits%20Involving%20C-Elements%2824pages%29.pdf
http://ir.unimas.my/9395/2/Soft%20Error%20Analysis%20and%20Mitigation%20In%20Circuits%20Involving%20C-Elements.pdf