The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical cha...
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| Format: | Article |
| Language: | English |
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JASPE
2015
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| Online Access: | http://ir.unimas.my/13739/ http://ir.unimas.my/13739/ http://ir.unimas.my/13739/1/The%20Impact%20of%20Soft%20Error%20on%20C-Elements%20Due%20to%20Process%20Corner%20Variation%20and%20Temperature%20%28abstract%29.pdf |