Advanced atomic force microscopy techniques II
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Beilstein Institute
2014
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Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/ |
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pubmed-42732682014-12-30 Advanced atomic force microscopy techniques II Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas Editorial Beilstein Institute 2014-12-03 /pmc/articles/PMC4273268/ /pubmed/25551060 http://dx.doi.org/10.3762/bjnano.5.241 Text en Copyright © 2014, Glatzel et al; licensee Beilstein Institute. http://www.beilstein-journals.org/bjnano This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano) |
repository_type |
Open Access Journal |
institution_category |
Foreign Institution |
institution |
US National Center for Biotechnology Information |
building |
NCBI PubMed |
collection |
Online Access |
language |
English |
format |
Online |
author |
Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas |
spellingShingle |
Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas Advanced atomic force microscopy techniques II |
author_facet |
Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas |
author_sort |
Glatzel, Thilo |
title |
Advanced atomic force microscopy techniques II |
title_short |
Advanced atomic force microscopy techniques II |
title_full |
Advanced atomic force microscopy techniques II |
title_fullStr |
Advanced atomic force microscopy techniques II |
title_full_unstemmed |
Advanced atomic force microscopy techniques II |
title_sort |
advanced atomic force microscopy techniques ii |
description |
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publisher |
Beilstein Institute |
publishDate |
2014 |
url |
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/ |
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1613169571498295296 |