Advanced atomic force microscopy techniques II

Bibliographic Details
Main Authors: Glatzel, Thilo, Garcia, Ricardo, Schimmel, Thomas
Format: Online
Language:English
Published: Beilstein Institute 2014
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/
id pubmed-4273268
recordtype oai_dc
spelling pubmed-42732682014-12-30 Advanced atomic force microscopy techniques II Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas Editorial Beilstein Institute 2014-12-03 /pmc/articles/PMC4273268/ /pubmed/25551060 http://dx.doi.org/10.3762/bjnano.5.241 Text en Copyright © 2014, Glatzel et al; licensee Beilstein Institute. http://www.beilstein-journals.org/bjnano This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano)
repository_type Open Access Journal
institution_category Foreign Institution
institution US National Center for Biotechnology Information
building NCBI PubMed
collection Online Access
language English
format Online
author Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
spellingShingle Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
Advanced atomic force microscopy techniques II
author_facet Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
author_sort Glatzel, Thilo
title Advanced atomic force microscopy techniques II
title_short Advanced atomic force microscopy techniques II
title_full Advanced atomic force microscopy techniques II
title_fullStr Advanced atomic force microscopy techniques II
title_full_unstemmed Advanced atomic force microscopy techniques II
title_sort advanced atomic force microscopy techniques ii
description
publisher Beilstein Institute
publishDate 2014
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/
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