Glatzel, T., Garcia, R., & Schimmel, T. (2014). Advanced atomic force microscopy techniques II. Beilstein Institute.
Chicago Style CitationGlatzel, Thilo, Ricardo Garcia, and Thomas Schimmel. Advanced Atomic Force Microscopy Techniques II. Beilstein Institute, 2014.
MLA CitationGlatzel, Thilo, Ricardo Garcia, and Thomas Schimmel. Advanced Atomic Force Microscopy Techniques II. Beilstein Institute, 2014.
Warning: These citations may not always be 100% accurate.