Advanced atomic force microscopy techniques

Bibliographic Details
Main Authors: Glatzel, Thilo, Hölscher, Hendrik, Schimmel, Thomas, Baykara, Mehmet Z, Schwarz, Udo D, Garcia, Ricardo
Format: Online
Language:English
Published: Beilstein-Institut 2012
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3554267/