Coherence properties of focused X-ray beams at high-brilliance synchrotron sources

Coherence properties of focused X-ray beams at high-brilliance synchrotron sources

An analytical approach describing properties of focused partially coherent X-ray beams is presented.

Bibliographic Details
Main Authors:	Singer, Andrej, Vartanyants, Ivan A.
Format:	Online
Language:	English
Published:	International Union of Crystallography 2014
Online Access:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874016/

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