Coherence properties of focused X-ray beams at high-brilliance synchrotron sources
An analytical approach describing properties of focused partially coherent X-ray beams is presented.
| Main Authors: | , |
|---|---|
| Format: | Online |
| Language: | English |
| Published: |
International Union of Crystallography
2014
|
| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3874016/ |