Hard X-ray nanofocusing at low-emittance synchrotron radiation sources
X-ray scanning microscopy greatly benefits from a reduced emittance of synchrotron radiation sources, especially from a diffraction-limited storage ring. Nanofocusing is discussed in view of focus size, flux and coherence.
| Main Authors: | , |
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| Format: | Online |
| Language: | English |
| Published: |
International Union of Crystallography
2014
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4151680/ |