Repulsive bimodal atomic force microscopy on polymers
Bimodal atomic force microscopy can provide high-resolution images of polymers. In the bimodal operation mode, two eigenmodes of the cantilever are driven simultaneously. When examining polymers, an effective mechanical contact is often required between the tip and the sample to obtain compositional...
| Main Authors: | , , , , , |
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| Format: | Online |
| Language: | English |
| Published: |
Beilstein-Institut
2012
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3388370/ |