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High‐speed TFT LCD defect‐dete...
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High‐speed TFT LCD defect‐detection system with genetic algorithm
Bibliographic Details
Main Authors:
Chern‐Sheng, Lin
,
Yo‐Chang, Liao
,
Yun‐Long, Lay
,
Kun‐Chen, Lee
,
Mau‐Shiun, Yeh
Format:
text
Language:
eng
Published:
Emerald
2008
Subjects:
Inspection,Automation,Transistors,Pattern recognition
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