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Automatic inspection and strat...
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Automatic inspection and strategy for surface defects in the PI coating process of TFT‐LCD panels
Bibliographic Details
Main Authors:
Chern‐Sheng, Lin
,
Jung, Kuo
,
Chi‐Chin, Lin
,
Yun‐Long, Lay
,
Hung‐Jung, Shei
Format:
text
Language:
eng
Published:
Emerald
2011
Subjects:
Automated test equipment,Assembly,Inspection and testing,Flaw detection,Sensor review,Coating processes
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Description
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