Search Results - The International Society for Optical Engineering
SPIE
SPIE (formerly the Society of Photographic Instrumentation Engineers, later the Society of Photo-Optical Instrumentation Engineers) is an international not-for-profit professional society for optics and photonics technology, founded in 1955. It organizes technical conferences, trade exhibitions, and continuing education programs for researchers and developers in the light-based fields of physics, including: optics, photonics, and imaging engineering. The society publishes peer-reviewed scientific journals, conference proceedings, monographs, tutorial texts, field guides, and reference volumes in print and online. SPIE is especially well-known for Photonics West, one of the laser and photonics industry's largest combined conferences and tradeshows which is held annually in San Francisco. SPIE also participates as partners in leading educational initiatives, and in 2020, for example, provided more than $5.8 million in support of optics education and outreach programs around the world.
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Lightmetry 2002 : metrology and testing techniques using light by Pluta, Maksymilian, Powichrowska, Ewa, Szyjer, Mariusz
Published 2003“…The International Society for Optical Engineering…”
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MEMS/MOEMS advances in photonic commmunications, sensing, metrology, packaging and assembly by Behringer, Uwe F.W
Published 2003“…The International Society for Optical Engineering…”
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Opto-Ireland 2002 optical metrology, imaging, and machine vision by Mahon, James, Murtagh, Fionn D., Shearer, Andrew, Whelan, Paul F. 1963-
Published 2003“…The International Society for Optical Engineering…”
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Metrology, inspection, and process control for microlithography XVII by Herr, Daniel J.
Published 2003“…The International Society for Optical Engineering…”
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Microsystems engineering Metrology and inspection III by Goreck, Christophe
Published 2003“…The International Society for Optical Engineering…”
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Optical metrology for arts and multimedia by Salimbeni, Renzo
Published 2003“…The International Society for Optical Engineering…”
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