Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

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Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far...

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Bibliographic Details
Main Authors:	Sweetman, Adam, Stannard, Andrew
Format:	Article
Published:	Beilstein-Institut 2014
Subjects:	Background subtraction DFM F(z) Force Atomic resolution NC-AFM Si(111) STM van der Waals
Online Access:	https://eprints.nottingham.ac.uk/31698/

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