Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces
In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far...
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| Format: | Article |
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Beilstein-Institut
2014
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| Online Access: | https://eprints.nottingham.ac.uk/31698/ |