Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor

Gigahertz Transverse Electromagnetic (GTEM) cell has been a popular test facility for evaluating integrated circuit (IC)- radiated emission. Since it is single-port test device, GTEM measurement cannot distinguish electric field component from magnetic field component. Rather, both fields are captur...

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Main Authors:	Chua, King Lee, Mohamed Jenu, Mohammad Zarar
Format:	Conference or Workshop Item
Published:	2015
Subjects:	TK7800-8360 Electronics
Online Access:	http://eprints.uthm.edu.my/7153/ http://eprints.uthm.edu.my/7153/1/IC3E_2015_submission_020.pdf

id	uthm-7153
recordtype	eprints
spelling	uthm-71532015-10-29T06:19:28Z Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor Chua, King Lee Mohamed Jenu, Mohammad Zarar TK7800-8360 Electronics Gigahertz Transverse Electromagnetic (GTEM) cell has been a popular test facility for evaluating integrated circuit (IC)- radiated emission. Since it is single-port test device, GTEM measurement cannot distinguish electric field component from magnetic field component. Rather, both fields are captured as a global quantity. It is therefore speculated that radiated emission measured using GTEM cell is less precise comparing with near-field probe scanning technique. Nonetheless, GTEM cell is cost-effective in providing sufficiently good ambient shielding to conduct field measurement at broad frequency range. Meanwhile, GTEM measurement typically is associated with semi-anechoic chamber (SAC) measurement. This study attempted to improve the correlation between GTEM and SAC through a correction factor. A specific circuitry pattern was constructed to replicate the wide-ranging IC interconnections and used for evaluation in GTEM cell and SAC. The horizontal and vertical electric fields based on GTEM measurement were preprocessed by MATLAB code to obtain the correction factor. Subsequently, the correction factor was employed to fine-tune any deviation arose from correlating the IC-radiated electric fields of GTEM cell to SAC. The results demonstrated a strong correlation coefficient upon regulation of GTEM fields with a correction factor, thereby offering a high-accuracy GTEM cell measurement strategy. 2015 Conference or Workshop Item PeerReviewed application/pdf http://eprints.uthm.edu.my/7153/1/IC3E_2015_submission_020.pdf Chua, King Lee and Mohamed Jenu, Mohammad Zarar (2015) Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor. In: International Conference on Electrical and Electronic Engineering 2015 (IC3E 2015), 10-11 August 2015 , Melaka, Malaysia. http://eprints.uthm.edu.my/7153/
repository_type	Digital Repository
institution_category	Local University
institution	Universiti Tun Hussein Onn Malaysia
building	UTHM Institutional Repository
collection	Online Access
topic	TK7800-8360 Electronics
spellingShingle	TK7800-8360 Electronics Chua, King Lee Mohamed Jenu, Mohammad Zarar Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
description	Gigahertz Transverse Electromagnetic (GTEM) cell has been a popular test facility for evaluating integrated circuit (IC)- radiated emission. Since it is single-port test device, GTEM measurement cannot distinguish electric field component from magnetic field component. Rather, both fields are captured as a global quantity. It is therefore speculated that radiated emission measured using GTEM cell is less precise comparing with near-field probe scanning technique. Nonetheless, GTEM cell is cost-effective in providing sufficiently good ambient shielding to conduct field measurement at broad frequency range. Meanwhile, GTEM measurement typically is associated with semi-anechoic chamber (SAC) measurement. This study attempted to improve the correlation between GTEM and SAC through a correction factor. A specific circuitry pattern was constructed to replicate the wide-ranging IC interconnections and used for evaluation in GTEM cell and SAC. The horizontal and vertical electric fields based on GTEM measurement were preprocessed by MATLAB code to obtain the correction factor. Subsequently, the correction factor was employed to fine-tune any deviation arose from correlating the IC-radiated electric fields of GTEM cell to SAC. The results demonstrated a strong correlation coefficient upon regulation of GTEM fields with a correction factor, thereby offering a high-accuracy GTEM cell measurement strategy.
format	Conference or Workshop Item
author	Chua, King Lee Mohamed Jenu, Mohammad Zarar
author_facet	Chua, King Lee Mohamed Jenu, Mohammad Zarar
author_sort	Chua, King Lee
title	Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
title_short	Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
title_full	Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
title_fullStr	Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
title_full_unstemmed	Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
title_sort	improved accuracy of gtem cell/sac-correlated measurement of ic-radiated electric fields by a correction factor
publishDate	2015
url	http://eprints.uthm.edu.my/7153/ http://eprints.uthm.edu.my/7153/1/IC3E_2015_submission_020.pdf
first_indexed	2018-09-05T11:32:04Z
last_indexed	2018-09-05T11:32:04Z
_version_	1610767007491293184

Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor

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