Improved accuracy of GTEM Cell/SAC-correlated measurement of IC-radiated electric fields by a correction factor
Gigahertz Transverse Electromagnetic (GTEM) cell has been a popular test facility for evaluating integrated circuit (IC)- radiated emission. Since it is single-port test device, GTEM measurement cannot distinguish electric field component from magnetic field component. Rather, both fields are captur...
| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://eprints.uthm.edu.my/7153/ http://eprints.uthm.edu.my/7153/1/IC3E_2015_submission_020.pdf |