Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes
Two-photon excitation techniques used in fabricating lines defects were done on a light emitting diode chip. Simultaneous detection of a quenched wide-gap semiconductor crystal has been observed using single- and two-photon photoluminescence. It was found at the quenched area, single-photon excitati...
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upm-477912016-07-15T08:43:56Z http://psasir.upm.edu.my/id/eprint/47791/ Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes Muhammad Noor, Ahmad Shukri Zainal Abidin, Mohd Shahnan Kawata, Yoshimasa Two-photon excitation techniques used in fabricating lines defects were done on a light emitting diode chip. Simultaneous detection of a quenched wide-gap semiconductor crystal has been observed using single- and two-photon photoluminescence. It was found at the quenched area, single-photon excitation gives photoluminescence read-out compared to two-photon excitation which no photoluminescence detected at the bandgap wavelength. This is due to the excitation states which the transition of electron for two-photon excitation to occur have been demolished by the annealing of the sample which involved two-photon quenching process. The dependency of excitation power with respective photoluminescence is elaborated to confirmed the single- and two-photon excitation photoluminescence methods. IEEE 2010 Conference or Workshop Item PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/47791/1/Two-photon%20photoluminescence%20induced%20defects%20on%20InGaN%20crystal%20and%20light%20emitting%20diodes.pdf Muhammad Noor, Ahmad Shukri and Zainal Abidin, Mohd Shahnan and Kawata, Yoshimasa (2010) Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes. In: 1st International Conference on Photonics 2010 (ICP 2010), 5-7 July 2010, Langkawi, Kedah. . 10.1109/ICP.2010.5604436 |
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Universiti Putra Malaysia |
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Online Access |
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English |
description |
Two-photon excitation techniques used in fabricating lines defects were done on a light emitting diode chip. Simultaneous detection of a quenched wide-gap semiconductor crystal has been observed using single- and two-photon photoluminescence. It was found at the quenched area, single-photon excitation gives photoluminescence read-out compared to two-photon excitation which no photoluminescence detected at the bandgap wavelength. This is due to the excitation states which the transition of electron for two-photon excitation to occur have been demolished by the annealing of the sample which involved two-photon quenching process. The dependency of excitation power with respective photoluminescence is elaborated to confirmed the single- and two-photon excitation photoluminescence methods. |
format |
Conference or Workshop Item |
author |
Muhammad Noor, Ahmad Shukri Zainal Abidin, Mohd Shahnan Kawata, Yoshimasa |
spellingShingle |
Muhammad Noor, Ahmad Shukri Zainal Abidin, Mohd Shahnan Kawata, Yoshimasa Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
author_facet |
Muhammad Noor, Ahmad Shukri Zainal Abidin, Mohd Shahnan Kawata, Yoshimasa |
author_sort |
Muhammad Noor, Ahmad Shukri |
title |
Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
title_short |
Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
title_full |
Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
title_fullStr |
Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
title_full_unstemmed |
Two-photon photoluminescence induced defects on InGaN crystal and light emitting diodes |
title_sort |
two-photon photoluminescence induced defects on ingan crystal and light emitting diodes |
publisher |
IEEE |
publishDate |
2010 |
url |
http://psasir.upm.edu.my/id/eprint/47791/ http://psasir.upm.edu.my/id/eprint/47791/ http://psasir.upm.edu.my/id/eprint/47791/1/Two-photon%20photoluminescence%20induced%20defects%20on%20InGaN%20crystal%20and%20light%20emitting%20diodes.pdf |
first_indexed |
2018-09-07T17:39:09Z |
last_indexed |
2018-09-07T17:39:09Z |
_version_ |
1610971296714194944 |