Measurement and Modeling of Short and Medium Range Order in Amorphous Ta2O5 Thin Films

Amorphous films and coatings are rapidly growing in importance. Yet, there is a dearth of high-quality structural data on sub-micron films. Not understanding how these materials assemble at atomic scale limits fundamental insights needed to improve their performance. Here, we use grazing-incidence x...

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Bibliographic Details
Main Authors: Shyam, Badri, Stone, Kevin H., Bassiri, Riccardo, Fejer, Martin M., Toney, Michael F., Mehta, Apurva
Format: Online
Language:English
Published: Nature Publishing Group 2016
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4999889/