Progress towards an optimal specimen support for electron cryomicroscopy
•Physical principles of electron scattering govern the design of specimen supports.•Radiation-induced motion causes loss of resolution in electron micrographs.•Specimen supports can now be designed to reduce specimen motion.•Tailored surfaces in the support allow control of particle distribution and...
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| Format: | Online |
| Language: | English |
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Elsevier Science
2016
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| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863039/ |
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pubmed-4863039 |
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oai_dc |
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pubmed-48630392016-05-19 Progress towards an optimal specimen support for electron cryomicroscopy Russo, Christopher J Passmore, Lori A Article •Physical principles of electron scattering govern the design of specimen supports.•Radiation-induced motion causes loss of resolution in electron micrographs.•Specimen supports can now be designed to reduce specimen motion.•Tailored surfaces in the support allow control of particle distribution and orientation.•Future developments in support technology will further improve image quality. Elsevier Science 2016-04 /pmc/articles/PMC4863039/ /pubmed/26774849 http://dx.doi.org/10.1016/j.sbi.2015.12.007 Text en © 2016 The Authors http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/). |
| repository_type |
Open Access Journal |
| institution_category |
Foreign Institution |
| institution |
US National Center for Biotechnology Information |
| building |
NCBI PubMed |
| collection |
Online Access |
| language |
English |
| format |
Online |
| author |
Russo, Christopher J Passmore, Lori A |
| spellingShingle |
Russo, Christopher J Passmore, Lori A Progress towards an optimal specimen support for electron cryomicroscopy |
| author_facet |
Russo, Christopher J Passmore, Lori A |
| author_sort |
Russo, Christopher J |
| title |
Progress towards an optimal specimen support for electron cryomicroscopy |
| title_short |
Progress towards an optimal specimen support for electron cryomicroscopy |
| title_full |
Progress towards an optimal specimen support for electron cryomicroscopy |
| title_fullStr |
Progress towards an optimal specimen support for electron cryomicroscopy |
| title_full_unstemmed |
Progress towards an optimal specimen support for electron cryomicroscopy |
| title_sort |
progress towards an optimal specimen support for electron cryomicroscopy |
| description |
•Physical principles of electron scattering govern the design of specimen supports.•Radiation-induced motion causes loss of resolution in electron micrographs.•Specimen supports can now be designed to reduce specimen motion.•Tailored surfaces in the support allow control of particle distribution and orientation.•Future developments in support technology will further improve image quality. |
| publisher |
Elsevier Science |
| publishDate |
2016 |
| url |
https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863039/ |
| _version_ |
1613577788415016960 |