Progress towards an optimal specimen support for electron cryomicroscopy
•Physical principles of electron scattering govern the design of specimen supports.•Radiation-induced motion causes loss of resolution in electron micrographs.•Specimen supports can now be designed to reduce specimen motion.•Tailored surfaces in the support allow control of particle distribution and...
| Main Authors: | , |
|---|---|
| Format: | Online |
| Language: | English |
| Published: |
Elsevier Science
2016
|
| Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4863039/ |