Advanced electron crystallography through model-based imaging
An overview of statistical parameter estimation methods is presented and applied to analyse transmission electron microscopy images in a quantitative manner.
Main Authors: | Van Aert, Sandra, De Backer, Annick, Martinez, Gerardo T., den Dekker, Arnold J., Van Dyck, Dirk, Bals, Sara, Van Tendeloo, Gustaaf |
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Format: | Online |
Language: | English |
Published: |
International Union of Crystallography
2016
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Online Access: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4704081/ |
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