Advanced electron crystallography through model-based imaging

An overview of statistical parameter estimation methods is presented and applied to analyse transmission electron microscopy images in a quantitative manner.

Bibliographic Details
Main Authors: Van Aert, Sandra, De Backer, Annick, Martinez, Gerardo T., den Dekker, Arnold J., Van Dyck, Dirk, Bals, Sara, Van Tendeloo, Gustaaf
Format: Online
Language:English
Published: International Union of Crystallography 2016
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4704081/