Direct Observation of the Biaxial Stress Effect on Efficiency Droop in GaN-based Light-emitting Diode under Electrical Injection

Light-emitting diode (LED) efficiency has attracted considerable interest because of the extended use of solid-state lighting. Owing to lack of direct measurement, identification of the reasons for efficiency droop has been restricted. A direct measurement technique is developed in this work for cha...

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Bibliographic Details
Main Authors: Zheng, Jinjian, Li, Shuiqing, Chou, Chilun, Lin, Wei, Xun, Feilin, Guo, Fei, Zheng, Tongchang, Li, Shuping, Kang, Junyong
Format: Online
Language:English
Published: Nature Publishing Group 2015
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4669452/