Carrier trapping and escape times in p-i-n GaInNAs MQW structures

We used a semi-classical model to describe carrier capture into and thermionic escape from GaInNAs/GaAs multiple quantum wells (MQWs) situated within the intrinsic region of a GaAs p-i-n junction. The results are used to explain photocurrent oscillations with applied bias observed in these structure...

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Bibliographic Details
Main Authors: Khalil, Hagir M, Balkan, Naci
Format: Online
Language:English
Published: Springer 2014
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3902426/