Optimizing the structure of scanning probes for atomic manipulation
Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a sample at the atomic scale. Techniques such as non-contact atomic force microscopy (NC-AFM), allows us to to characterize the forces present on a surface, resolve the atomic structure of molecules or...
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| Format: | Thesis (University of Nottingham only) |
| Language: | English |
| Published: |
2017
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| Online Access: | http://eprints.nottingham.ac.uk/44916/ http://eprints.nottingham.ac.uk/44916/1/PhD%20Thesis.pdf |