Novel scanning probe microscope instrumentation with applications in nanotechnology
A versatile scanning probe microscope controller has been constructed. Its suitability for the control of a range of different scanning probe microscope heads has been demonstrated. These include an ultra high vacuum scanning tunnelling microscope, with which atomic resolution images of Si surfaces...
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| Format: | Thesis (University of Nottingham only) |
| Language: | English |
| Published: |
2000
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| Online Access: | http://eprints.nottingham.ac.uk/13743/ http://eprints.nottingham.ac.uk/13743/1/325727.pdf |