Characterization, testing, measurement, and metrology

"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...

Full description

Bibliographic Details
Other Authors: Davim, J. Paulo (Editor), Prakash, Chander (Editor), Singh, Sunpreet , 1989- (Editor)
Format: Book
Language:English
Published: Boca Raton, FL : CRC Press 2020
Series:Manufacturing design and technology series
Subjects:

Similar Items