Characterization, testing, measurement, and metrology
"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...
| Other Authors: | Davim, J. Paulo (Editor), Prakash, Chander (Editor), Singh, Sunpreet , 1989- (Editor) |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boca Raton, FL :
CRC Press
2020
|
| Series: | Manufacturing design and technology series
|
| Subjects: |
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