Characterization, testing, measurement, and metrology

"This book presents the broad aspects of measurement, performance analysis, and characterization for materials and devices by advanced manufacturing processes. The field of measurement and metrology as a pre-condition for maintaining high quality products/devices/systems in materials and advanc...

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Bibliographic Details
Other Authors: Davim, J. Paulo (Editor), Prakash, Chander (Editor), Singh, Sunpreet , 1989- (Editor)
Format: Book
Language:English
Published: Boca Raton, FL : CRC Press 2020
Series:Manufacturing design and technology series
Subjects:

Badak Academic Core Collection

Holdings details from Badak Academic Core Collection
Call Number: TA410 C43 2021
Accession Item Category Format Status Notes
1000182678 Open Shelf (1 Day) Book Available