Characterization and metrology for ULSI technology 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 editors, Davig G. Seiler ...[et al.]

Characterization and metrology for ULSI technology 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003

Bibliographic Details
Main Author: Seiler, David G. (Author)
Corporate Authors: International Conference on Characterization and Metrology for ULSI Technology, National Institute of Standards and Technology
Format: Book
Published: Melville, NY American Institute of Physics c2003
Subjects:
Integrated circuits > Ultra large scale integration > Congresses
Integrated circuits > Ultra large scale integration > Congresses > Software

Tembila General Collection

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Call Number: TK7874 76 I56 2003 KIT
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1000099628 OPEN SHELF (30 DAYS) Book Available

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Call Number: TK7874 76 I56 2003 KIT
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1000099629 OPEN SHELF (30 DAYS) CD-ROM Sorting

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