Opto-Ireland 2002 optical metrology, imaging, and machine vision

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Opto-Ireland 2002 optical metrology, imaging, and machine vision

Bibliographic Details
Main Authors:	Mahon, James (Author), Murtagh, Fionn D. (Author), Shearer, Andrew (Author), Whelan, Paul F. 1963- (Author)
Corporate Author:	The International Society for Optical Engineering
Format:	Book
Published:	Washington SPIE c2003
Series:	SPIE proceedings series 4877
Subjects:	Computer vision > Congresses Image processing > Congresses Optical measurements > Congresses

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