Opto-Ireland 2002 optical metrology, imaging, and machine vision

Opto-Ireland 2002 optical metrology, imaging, and machine vision

Bibliographic Details
Main Authors: Mahon, James (Author), Murtagh, Fionn D. (Author), Shearer, Andrew (Author), Whelan, Paul F. 1963- (Author)
Corporate Author: The International Society for Optical Engineering
Format: Book
Published: Washington SPIE c2003
Series:SPIE proceedings series 4877
Subjects:
Computer vision > Congresses
Image processing > Congresses
Optical measurements > Congresses

Badak Reference Collection

Holdings details from Badak Reference Collection
Call Number: TA1634 O68 2002
Accession Item Category Format Status Notes
1000099378 Reference Book Available

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