Opto-Ireland 2002 optical metrology, imaging, and machine vision

Bibliographic Details
Main Authors: Mahon, James (Author), Murtagh, Fionn D. (Author), Shearer, Andrew (Author), Whelan, Paul F. 1963- (Author)
Corporate Author: The International Society for Optical Engineering
Format: Book
Published: Washington SPIE c2003
Series:SPIE proceedings series 4877
Subjects:

MARC

LEADER 00000cam a2200000 7i4500
001 0000047200
008 040628s2003
020 |a 0819446580 
090 0 0 |a TA1634  |b .O68 2002 
245 1 0 |a Opto-Ireland 2002  |b optical metrology, imaging, and machine vision 
260 2 |a Washington  |b SPIE  |c c2003 
300 |a vii, 282 p.  |b ill.  |c 28 cm 
440 0 0 |a SPIE proceedings series  |v 4877 
650 0 |a Computer vision  |x Congresses 
650 0 |a Image processing  |v Congresses 
650 0 |a Optical measurements  |v Congresses 
700 1 |a Mahon, James  |e author 
700 1 |a Murtagh, Fionn D.  |e author 
700 1 |a Shearer, Andrew  |e author 
700 1 |a Whelan, Paul F.  |d 1963-  |e author 
710 1 1 |a The International Society for Optical Engineering 
740 0 0 |a Proceedings of SPIE 
999 |a 1000099378  |b Book  |c Reference  |e Gong Badak Campus