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| 001 |
0000047200 |
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20230227093000.0 |
| 008 |
040628s2003 |
| 020 |
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|a 0819446580
|
| 090 |
0 |
0 |
|a TA1634
|b .O68 2002
|
| 245 |
1 |
0 |
|a Opto-Ireland 2002 :
|b optical metrology, imaging, and machine vision
|
| 260 |
2 |
|
|a Washington :
|b SPIE ,
|c c2003
|
| 300 |
|
|
|a vii, 282 p. :
|b ill. ;
|c 28 cm.
|
| 440 |
0 |
0 |
|a SPIE proceedings series
|v 4877
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 650 |
|
0 |
|a Computer vision
|x Congresses
|
| 650 |
|
0 |
|a Image processing
|v Congresses
|
| 650 |
|
0 |
|a Optical measurements
|v Congresses
|
| 700 |
1 |
|
|a Mahon, James ,
|e author
|
| 700 |
1 |
|
|a Murtagh, Fionn D. ,
|e author
|
| 700 |
1 |
|
|a Shearer, Andrew ,
|e author
|
| 700 |
1 |
|
|a Whelan, Paul F. ,
|d 1963- ,
|e author
|
| 710 |
1 |
1 |
|a The International Society for Optical Engineering
|
| 740 |
0 |
0 |
|a Proceedings of SPIE
|
| 999 |
|
|
|a 1000099378
|b Book
|c Reference
|e Gong Badak Campus
|