Opto-Ireland 2002 : optical metrology, imaging, and machine vision

Bibliographic Details
Main Authors: Mahon, James (Author), Murtagh, Fionn D. (Author), Shearer, Andrew (Author), Whelan, Paul F. , 1963- (Author)
Corporate Author: The International Society for Optical Engineering
Format: Book
Published: Washington : SPIE , c2003
Series:SPIE proceedings series 4877
Subjects:

MARC

LEADER 00000cam a2200000 7i4500
001 0000047200
005 20230227093000.0
008 040628s2003
020 |a 0819446580 
090 0 0 |a TA1634   |b .O68 2002 
245 1 0 |a Opto-Ireland 2002 :   |b optical metrology, imaging, and machine vision 
260 2 |a Washington :   |b SPIE ,   |c c2003 
300 |a vii, 282 p. :   |b ill. ;   |c 28 cm. 
440 0 0 |a SPIE proceedings series   |v 4877 
504 |a Includes bibliographical references and index 
650 0 |a Computer vision   |x Congresses 
650 0 |a Image processing   |v Congresses 
650 0 |a Optical measurements   |v Congresses 
700 1 |a Mahon, James ,   |e author 
700 1 |a Murtagh, Fionn D. ,   |e author 
700 1 |a Shearer, Andrew ,   |e author 
700 1 |a Whelan, Paul F. ,   |d 1963- ,   |e author 
710 1 1 |a The International Society for Optical Engineering 
740 0 0 |a Proceedings of SPIE 
999 |a 1000099378   |b Book   |c Reference   |e Gong Badak Campus