Opto-Ireland 2002 optical metrology, imaging, and machine vision
| Main Authors: | , , , |
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| Corporate Author: | |
| Format: | Book |
| Published: |
Washington
SPIE
c2003
|
| Series: | SPIE proceedings series
4877 |
| Subjects: |
| Physical Description: | vii, 282 p. ill. 28 cm |
|---|---|
| ISBN: | 0819446580 |