Opto-Ireland 2002 : optical metrology, imaging, and machine vision
| Main Authors: | , , , |
|---|---|
| Corporate Author: | |
| Format: | Book |
| Published: |
Washington :
SPIE ,
c2003
|
| Series: | SPIE proceedings series
4877 |
| Subjects: |
| Physical Description: | vii, 282 p. : ill. ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index |
| ISBN: | 0819446580 |