Mahon, J., Murtagh, F. D., Shearer, A., & Whelan, P. F. (2003). Opto-Ireland 2002: Optical metrology, imaging, and machine vision. SPIE.
Chicago Style (17th ed.) CitationMahon, James, Fionn D. Murtagh, Andrew Shearer, and Paul F. Whelan. Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision. Washington: SPIE, 2003.
MLA (9th ed.) CitationMahon, James, et al. Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision. SPIE, 2003.
Warning: These citations may not always be 100% accurate.