Study on A.C properties of tin selenidethin films

A.c properties of tin selenide thin films prepared by an encapsulated selenization method are investigated. The measurements obtained from al/snse/al sandwich structures showed strong indication of frequency and temperature dependence of capacitance, dielectric loss and conductance over the ranges o...

Full description

Bibliographic Details
Main Authors: Sakrani, Samsudi, Othaman, Zulkafli, Deraman, Karim, Wahab, Yussof
Format: Article
Language:English
Published: Faculty of Science, Universiti Teknologi Malaysia 2008
Subjects:
Online Access:http://eprints.utm.my/8573/
http://eprints.utm.my/8573/1/SamsudiSakrani2008_AStudyOnACProperties.pdf
_version_ 1848891719505936384
author Sakrani, Samsudi
Othaman, Zulkafli
Deraman, Karim
Wahab, Yussof
author_facet Sakrani, Samsudi
Othaman, Zulkafli
Deraman, Karim
Wahab, Yussof
author_sort Sakrani, Samsudi
building UTeM Institutional Repository
collection Online Access
description A.c properties of tin selenide thin films prepared by an encapsulated selenization method are investigated. The measurements obtained from al/snse/al sandwich structures showed strong indication of frequency and temperature dependence of capacitance, dielectric loss and conductance over the ranges of 5-200 khz and 228-373 k, respectively. Dielectric behaviour was expected to be due to space charge polarization which contributed to a.c conduction. This was generally explained in terms of hopping of the charge carriers between localized states with activation energies 0.03-0.08 ev. Parameters such as trap binding energy (0.94 ev) and minimum hopping distance (1.01 nm) were also predicted
first_indexed 2025-11-15T21:02:26Z
format Article
id utm-8573
institution Universiti Teknologi Malaysia
institution_category Local University
language English
last_indexed 2025-11-15T21:02:26Z
publishDate 2008
publisher Faculty of Science, Universiti Teknologi Malaysia
recordtype eprints
repository_type Digital Repository
spelling utm-85732017-03-12T01:20:16Z http://eprints.utm.my/8573/ Study on A.C properties of tin selenidethin films Sakrani, Samsudi Othaman, Zulkafli Deraman, Karim Wahab, Yussof QC Physics A.c properties of tin selenide thin films prepared by an encapsulated selenization method are investigated. The measurements obtained from al/snse/al sandwich structures showed strong indication of frequency and temperature dependence of capacitance, dielectric loss and conductance over the ranges of 5-200 khz and 228-373 k, respectively. Dielectric behaviour was expected to be due to space charge polarization which contributed to a.c conduction. This was generally explained in terms of hopping of the charge carriers between localized states with activation energies 0.03-0.08 ev. Parameters such as trap binding energy (0.94 ev) and minimum hopping distance (1.01 nm) were also predicted Faculty of Science, Universiti Teknologi Malaysia 2008 Article PeerReviewed application/pdf en http://eprints.utm.my/8573/1/SamsudiSakrani2008_AStudyOnACProperties.pdf Sakrani, Samsudi and Othaman, Zulkafli and Deraman, Karim and Wahab, Yussof (2008) Study on A.C properties of tin selenidethin films. Jurnal Fizik UTM, 3 . pp. 99-108. ISSN 0128-8644
spellingShingle QC Physics
Sakrani, Samsudi
Othaman, Zulkafli
Deraman, Karim
Wahab, Yussof
Study on A.C properties of tin selenidethin films
title Study on A.C properties of tin selenidethin films
title_full Study on A.C properties of tin selenidethin films
title_fullStr Study on A.C properties of tin selenidethin films
title_full_unstemmed Study on A.C properties of tin selenidethin films
title_short Study on A.C properties of tin selenidethin films
title_sort study on a.c properties of tin selenidethin films
topic QC Physics
url http://eprints.utm.my/8573/
http://eprints.utm.my/8573/1/SamsudiSakrani2008_AStudyOnACProperties.pdf