On Defect Oriented Testing for Hybrid CMOS/memristor Memory

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On Defect Oriented Testing for Hybrid CMOS/memristor Memory

Hybrid CMOS/memristor memory (hybrid memory) technology is one of the emerging memory technologies potentially to replace conventional non-volatile flash memory. Existing research on such novel circuits focuses mainly on the integration between CMOS and non-CMOS, fabrication techniques and reliabili...

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Bibliographic Details
Main Authors:	Haron, Nor Zaidi, Hamdioui, Said
Format:	Conference or Workshop Item
Language:	English
Published:	2011
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.utem.edu.my/id/eprint/3758/ http://eprints.utem.edu.my/id/eprint/3758/1/NZBHaron_ATS11.pdf

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