On Defect Oriented Testing for Hybrid CMOS/memristor Memory
Hybrid CMOS/memristor memory (hybrid memory) technology is one of the emerging memory technologies potentially to replace conventional non-volatile flash memory. Existing research on such novel circuits focuses mainly on the integration between CMOS and non-CMOS, fabrication techniques and reliabili...
| Main Authors: | , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2011
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| Subjects: | |
| Online Access: | http://eprints.utem.edu.my/id/eprint/3758/ http://eprints.utem.edu.my/id/eprint/3758/1/NZBHaron_ATS11.pdf |