APA (7th ed.) Citation

Lim, Y. P. (2023). Wafer map defect pattern classification using deep learning model.

Chicago Style (17th ed.) Citation

Lim, Yu Pin. Wafer Map Defect Pattern Classification Using Deep Learning Model. 2023.

MLA (9th ed.) Citation

Lim, Yu Pin. Wafer Map Defect Pattern Classification Using Deep Learning Model. 2023.

Warning: These citations may not always be 100% accurate.