Software User Interface and Algorithm Development for Signal and Noise Characterization
Atomic force microscopy (AFM) also known as “Scanning force microscopy (SFM)” is high resolution scanning probe. The resolution of scanning object is reached to the order of fractions of a nanometer. Its advantage is the performance of AFM is better than optical diffraction. The wide application ran...
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| Format: | Final Year Project / Dissertation / Thesis |
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2015
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| Online Access: | http://eprints.utar.edu.my/1793/ http://eprints.utar.edu.my/1793/1/Software_User_Interface_and_Algorithm_Development_for_Signal_and_Noise_Characterization.pdf |