Modeling and measuring dielectric constants for very thin materials using a coaxial probe
This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Radioengineering Society
2014
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| Online Access: | http://psasir.upm.edu.my/id/eprint/34543/ http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf |
| _version_ | 1848847802260520960 |
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| author | You, Kok Yeow Abbas, Zulkifly Lee, Chia Yew Abd Malek, Mohd Fareq Lee, Kim Yee Cheng, Ee Meng |
| author_facet | You, Kok Yeow Abbas, Zulkifly Lee, Chia Yew Abd Malek, Mohd Fareq Lee, Kim Yee Cheng, Ee Meng |
| author_sort | You, Kok Yeow |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constants using an empirical reflection coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of the model were obtained by fitting the data using the Finite Element Method (FEM). |
| first_indexed | 2025-11-15T09:24:23Z |
| format | Article |
| id | upm-34543 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-15T09:24:23Z |
| publishDate | 2014 |
| publisher | Radioengineering Society |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-345432016-09-19T03:50:34Z http://psasir.upm.edu.my/id/eprint/34543/ Modeling and measuring dielectric constants for very thin materials using a coaxial probe You, Kok Yeow Abbas, Zulkifly Lee, Chia Yew Abd Malek, Mohd Fareq Lee, Kim Yee Cheng, Ee Meng This paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1-0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constants using an empirical reflection coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of the model were obtained by fitting the data using the Finite Element Method (FEM). Radioengineering Society 2014 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf You, Kok Yeow and Abbas, Zulkifly and Lee, Chia Yew and Abd Malek, Mohd Fareq and Lee, Kim Yee and Cheng, Ee Meng (2014) Modeling and measuring dielectric constants for very thin materials using a coaxial probe. Radioengineering, 23 (4). pp. 1016-1025. ISSN 1210-2512; ESSN: 1805-9600 |
| spellingShingle | You, Kok Yeow Abbas, Zulkifly Lee, Chia Yew Abd Malek, Mohd Fareq Lee, Kim Yee Cheng, Ee Meng Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title | Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title_full | Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title_fullStr | Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title_full_unstemmed | Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title_short | Modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| title_sort | modeling and measuring dielectric constants for very thin materials using a coaxial probe |
| url | http://psasir.upm.edu.my/id/eprint/34543/ http://psasir.upm.edu.my/id/eprint/34543/1/Modeling%20and%20measuring%20dielectric%20constants%20for%20very%20thin%20materials%20using%20a%20coaxial%20probe.pdf |