Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics.
The optical band-gap energy (Eg) is an important feature of semiconductors which determines their applications in optoelectronics. Therefore, it is necessary to investigate the electronic states of ceramic ZnO and the effect of doped impurities under different processing conditions. Eg of the cerami...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Language: | English English |
| Published: |
MDPI
2011
|
| Online Access: | http://psasir.upm.edu.my/id/eprint/24922/ http://psasir.upm.edu.my/id/eprint/24922/1/Use%20of%20a%20reflectance%20spectroscopy%20accessory%20for%20optical%20characterization%20of%20ZnO.pdf |
| _version_ | 1848845168095002624 |
|---|---|
| author | Mohd Ghazali, Mohd Sabri Zakaria, Azmi Rizwan, Zahid Mohamed Kamari, Halimah Hashim, Mansor Mohd Zaid, Mohd Hafiz Zamiri, Reza |
| author_facet | Mohd Ghazali, Mohd Sabri Zakaria, Azmi Rizwan, Zahid Mohamed Kamari, Halimah Hashim, Mansor Mohd Zaid, Mohd Hafiz Zamiri, Reza |
| author_sort | Mohd Ghazali, Mohd Sabri |
| building | UPM Institutional Repository |
| collection | Online Access |
| description | The optical band-gap energy (Eg) is an important feature of semiconductors which determines their applications in optoelectronics. Therefore, it is necessary to investigate the electronic states of ceramic ZnO and the effect of doped impurities under different processing conditions. Eg of the ceramic ZnO + xBi2O3 + xTiO2, where x = 0.5 mol%, was determined using a UV-Vis spectrophotometer attached to a Reflectance Spectroscopy Accessory for powdered samples. The samples was prepared using the solid-state route and sintered at temperatures from 1140 to 1260 °C for 45 and 90 minutes. Eg was observed to decrease with an increase of sintering temperature. XRD analysis indicated hexagonal ZnO and few small peaks of intergranular layers of secondary phases. The relative density of the sintered ceramics decreased and the average grain size increased with the increase of sintering temperature. |
| first_indexed | 2025-11-15T08:42:31Z |
| format | Article |
| id | upm-24922 |
| institution | Universiti Putra Malaysia |
| institution_category | Local University |
| language | English English |
| last_indexed | 2025-11-15T08:42:31Z |
| publishDate | 2011 |
| publisher | MDPI |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | upm-249222015-10-16T07:49:13Z http://psasir.upm.edu.my/id/eprint/24922/ Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. Mohd Ghazali, Mohd Sabri Zakaria, Azmi Rizwan, Zahid Mohamed Kamari, Halimah Hashim, Mansor Mohd Zaid, Mohd Hafiz Zamiri, Reza The optical band-gap energy (Eg) is an important feature of semiconductors which determines their applications in optoelectronics. Therefore, it is necessary to investigate the electronic states of ceramic ZnO and the effect of doped impurities under different processing conditions. Eg of the ceramic ZnO + xBi2O3 + xTiO2, where x = 0.5 mol%, was determined using a UV-Vis spectrophotometer attached to a Reflectance Spectroscopy Accessory for powdered samples. The samples was prepared using the solid-state route and sintered at temperatures from 1140 to 1260 °C for 45 and 90 minutes. Eg was observed to decrease with an increase of sintering temperature. XRD analysis indicated hexagonal ZnO and few small peaks of intergranular layers of secondary phases. The relative density of the sintered ceramics decreased and the average grain size increased with the increase of sintering temperature. MDPI 2011-01 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/24922/1/Use%20of%20a%20reflectance%20spectroscopy%20accessory%20for%20optical%20characterization%20of%20ZnO.pdf Mohd Ghazali, Mohd Sabri and Zakaria, Azmi and Rizwan, Zahid and Mohamed Kamari, Halimah and Hashim, Mansor and Mohd Zaid, Mohd Hafiz and Zamiri, Reza (2011) Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. International Journal of Molecular Sciences, 12 (3). pp. 1496-1504. ISSN 1422-0067; ESSN:1422-0067 http://www.mdpi.com/ 10.3390/ijms12031496 English |
| spellingShingle | Mohd Ghazali, Mohd Sabri Zakaria, Azmi Rizwan, Zahid Mohamed Kamari, Halimah Hashim, Mansor Mohd Zaid, Mohd Hafiz Zamiri, Reza Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title | Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title_full | Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title_fullStr | Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title_full_unstemmed | Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title_short | Use of a reflectance spectroscopy accessory for optical characterization of ZnO-Bi2O3-TiO2 ceramics. |
| title_sort | use of a reflectance spectroscopy accessory for optical characterization of zno-bi2o3-tio2 ceramics. |
| url | http://psasir.upm.edu.my/id/eprint/24922/ http://psasir.upm.edu.my/id/eprint/24922/ http://psasir.upm.edu.my/id/eprint/24922/ http://psasir.upm.edu.my/id/eprint/24922/1/Use%20of%20a%20reflectance%20spectroscopy%20accessory%20for%20optical%20characterization%20of%20ZnO.pdf |