Development of ect probe for back side crack evaluation

Development of ect probe for back side crack evaluation

Cracks are known as one of the defects that usually happen within a steel structure such as piping, funnel, bridges, buildings and other civil engineering structures, and can occur on the surface or subsurface of the structures. Detection of crack is crucial since cracking can cause dangerous damage...

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Bibliographic Details
Main Authors: Nurul A’in, Nadzri, Mohd Mawardi, Saari, Mohd Aufa Hadi Putera, Zaini, Zulkifly, Ab Aziz, Nur Huda, Ramlan, Aiman, Mohd Halil
Format: Conference or Workshop Item
Language:English
English
Published: IEEE 2020
Subjects:
TJ Mechanical engineering and machinery
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://umpir.ump.edu.my/id/eprint/29126/
http://umpir.ump.edu.my/id/eprint/29126/1/21.%20Development%20of%20ect%20probe%20for%20back%20side%20crack%20evaluation.pdf
http://umpir.ump.edu.my/id/eprint/29126/2/21.1%20Development%20of%20ect%20probe%20for%20back%20side%20crack%20evaluation.pdf

Internet

http://umpir.ump.edu.my/id/eprint/29126/
http://umpir.ump.edu.my/id/eprint/29126/1/21.%20Development%20of%20ect%20probe%20for%20back%20side%20crack%20evaluation.pdf
http://umpir.ump.edu.my/id/eprint/29126/2/21.1%20Development%20of%20ect%20probe%20for%20back%20side%20crack%20evaluation.pdf

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