Soon, F. Y. (2012). Characterization of pMosfet degradation in negative bias temperature instability test / Soon Foo Yew.
Chicago Style (17th ed.) CitationSoon, Foo Yew. Characterization of PMosfet Degradation in Negative Bias Temperature Instability Test / Soon Foo Yew. 2012.
MLA (9th ed.) CitationSoon, Foo Yew. Characterization of PMosfet Degradation in Negative Bias Temperature Instability Test / Soon Foo Yew. 2012.
Warning: These citations may not always be 100% accurate.