Oxidation-induced stacking fault in (100) and (111) silicon wafers / Liang Mei Keat.

Bibliographic Details
Main Author:	Liang, Mei Keat
Format:	Thesis
Published:	2002
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://www.pendeta.um.edu.my/uhtbin/cgisirsi/x/P01UTAMA/0/5?searchdata1="Oxidation-induced stacking fault in (100) and (111) silicon wafers"{245} http://studentsrepo.um.edu.my/2316/1/ABSTRAK.pdf http://studentsrepo.um.edu.my/2316/2/KANDUNGAN.pdf http://studentsrepo.um.edu.my/2316/3/PENDAHULUAN.pdf http://studentsrepo.um.edu.my/2316/4/BAB_1.pdf http://studentsrepo.um.edu.my/2316/5/BAB_2.pdf http://studentsrepo.um.edu.my/2316/6/BAB_3.pdf http://studentsrepo.um.edu.my/2316/7/BAB_4.pdf http://studentsrepo.um.edu.my/2316/8/BAB_5.pdf http://studentsrepo.um.edu.my/2316/9/BAB_6.pdf http://studentsrepo.um.edu.my/2316/10/BAB_7.pdf http://studentsrepo.um.edu.my/2316/11/BIBLIOGRAFI.pdf http://studentsrepo.um.edu.my/2316/12/LAMPIRAN.pdf

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