APA (7th ed.) Citation

M.B.I., R., W.F., L., N.H., H., H.H., L., & A.Y.M., S. (2009). High degree of testability using full scan chain and ATPG-An industrial perspective.

Chicago Style (17th ed.) Citation

M.B.I., Reaz, Lee W.F., Hamid N.H., Lo H.H., and Shakaff A.Y.M. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. 2009.

MLA (9th ed.) Citation

M.B.I., Reaz, et al. High Degree of Testability Using Full Scan Chain and ATPG-An Industrial Perspective. 2009.