Machine learning at the nanoscale

Machine learning at the nanoscale

Although scanning probe microscopy (SPM) techniques have allowed researchers to interact with the nanoscale for decades now, little improvement has been made to the incredibly manual, time consuming process of setting up, running, and analysing the results of these experiments, oft...

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Bibliographic Details
Main Author: Gordon, Oliver Miles
Format: Thesis (University of Nottingham only)
Language:English
Published: 2022
Subjects:
CNN
Machine learning
STM
AFM
SPM
Scanning probes
Reinforcement learning
Inverse reinforcement learning
RL
IRL
Neural network
H:Si(100)
Online Access:https://eprints.nottingham.ac.uk/67430/

Internet

https://eprints.nottingham.ac.uk/67430/

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